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[IEEE 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Toronto, ON, Canada (2016.10.16-2016.10.19)] 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Modeling of secondary electron emission and charge trapping in an insulator under an electronic beam
Damamme, G., Ghorbel, N., Si Ahmed, A., Said, K., Moya, G.Year:
2016
Language:
english
DOI:
10.1109/CEIDP.2016.7785520
File:
PDF, 307 KB
english, 2016