[IEEE 2016 10th International Conference on Sensing Technology (ICST) - Nanjing, China (2016.11.11-2016.11.13)] 2016 10th International Conference on Sensing Technology (ICST) - Calibration of a contact probe for micro-nano CMM
Huang, Qiangxian, Mei, Jian, Guo, Qiang, Li, Ruijun, Gong, Ermin, Chen, LijuanYear:
2016
Language:
english
DOI:
10.1109/ICSensT.2016.7796305
File:
PDF, 4.99 MB
english, 2016