[IEEE 2016 10th International Conference on Sensing...

  • Main
  • [IEEE 2016 10th International...

[IEEE 2016 10th International Conference on Sensing Technology (ICST) - Nanjing, China (2016.11.11-2016.11.13)] 2016 10th International Conference on Sensing Technology (ICST) - Calibration of a contact probe for micro-nano CMM

Huang, Qiangxian, Mei, Jian, Guo, Qiang, Li, Ruijun, Gong, Ermin, Chen, Lijuan
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
2016
Language:
english
DOI:
10.1109/ICSensT.2016.7796305
File:
PDF, 4.99 MB
english, 2016
Conversion to is in progress
Conversion to is failed