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IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems 2017

Triple Patterning Aware Detailed Placement Toward Zero Cross-Row Middle-of-Line Conflict

Lin, Yibo, Yu, Bei, Xu, Biying, Pan, David Z.
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/TCAD.2017.2648843
File:
PDF, 2.90 MB
english, 2017
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