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[IEEE 2016 15th Biennial Baltic Electronics Conference (BEC) - Tallinn, Estonia (2016.10.3-2016.10.5)] 2016 15th Biennial Baltic Electronics Conference (BEC) - A tool for random test generation targeting high diagnostic resolution
Osimiry, Emmanuel Ovie, Kostin, Sergei, Raik, Jaan, Ubar, RaimundYear:
2016
Language:
english
DOI:
10.1109/bec.2016.7743733
File:
PDF, 309 KB
english, 2016