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[IEEE 2016 XII International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH) - Lviv - Polyana, Ukraine (2016.4.20-2016.4.24)] 2016 XII International Conference on Perspective Technologies and Methods in MEMS Design (MEMSTECH) - Automated simulation of scanning tunneling microscope functional parameters
Maisakovskyi, Roman, Kolesnyk, Konstantin, Panchak, Roman, Golovatskyy, RuslanYear:
2016
Language:
english
DOI:
10.1109/memstech.2016.7507530
File:
PDF, 248 KB
english, 2016