An Ultrafast I-V Measurement Technique Accounting for...

Materials Science Forum 2016 / 5 Vol. 858

An Ultrafast I-V Measurement Technique Accounting for Capacitive and Leakage Currents in Reverse Mode for SiC Power Devices

Fonder, Jean Baptiste, Brosselard, Pierre, Tournier, Dominique, Berthou, Maxime, Vergne, Bertrand
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
858
Language:
english
Journal:
Materials Science Forum
DOI:
10.4028/www.scientific.net/MSF.858.422
Date:
May, 2016
File:
PDF, 1.08 MB
english, 2016
Conversion to is in progress
Conversion to is failed