Theoretical study of depth profiling with gamma- and X-ray...

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Theoretical study of depth profiling with gamma- and X-ray spectrometry based on measurements of intensity ratios

Bártová, H., Trojek, T., Johnová, K.
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Language:
english
Journal:
Radiation Physics and Chemistry
DOI:
10.1016/j.radphyschem.2017.01.014
Date:
January, 2017
File:
PDF, 615 KB
english, 2017
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