Evolution of the resistive switching in chemical solution deposited-derived BiFeO 3 thin films with dwell time and annealing temperature
Tang, Xianwu, Zhu, Xuebin, Dai, Jianming, Yang, Jie, Chen, Li, Sun, YupingVolume:
113
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4789265
Date:
January, 2013
File:
PDF, 2.48 MB
english, 2013