Dislocations in laser-doped silicon detected by micro-photoluminescence spectroscopy
Nguyen, Hieu T., Han, Young, Ernst, Marco, Fell, Andreas, Franklin, Evan, Macdonald, DanielVolume:
107
Language:
english
Journal:
Applied Physics Letters
DOI:
10.1063/1.4926360
Date:
July, 2015
File:
PDF, 721 KB
english, 2015