Trade-off between the electrostatic efficiency and mechanical stability of two-stage field emitter structures
de Assis, Thiago A., Dall'Agnol, Fernando F.Volume:
121
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4973584
Date:
January, 2017
File:
PDF, 1.02 MB
english, 2017