[IEEE 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Chongqing, China (2016.7.18-2016.7.22)] 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - A manufacturing method of achromatic focus metasurface
Li, Zhe, Zhang, Hengxu, Wu, Boqi, Dong, Lianhe, Sun, Yanjun, Leng, Yanbing, Wang, LiYear:
2016
Language:
english
DOI:
10.1109/3M-NANO.2016.7824951
File:
PDF, 430 KB
english, 2016