[IEEE 2016 IEEE International Conference on Manipulation,...

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[IEEE 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - Chongqing, China (2016.7.18-2016.7.22)] 2016 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO) - The direction and stability control system for near-field electrospinning direct-writing technology

Zeng, Jun, Chen, Xin, Wang, Han, Wu, Peixuan, Fang, Feiyu, Liang, Feng, Ou, Weijun, Yan, Wenkai, Yang, Yanming, Zeng, Yaobin, Li, Zhijin, Hu, Furen
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Year:
2016
Language:
english
DOI:
10.1109/3M-NANO.2016.7824960
File:
PDF, 442 KB
english, 2016
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