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[IEEE 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Toronto, ON, Canada (2016.10.16-2016.10.19)] 2016 IEEE Conference on Electrical Insulation and Dielectric Phenomena (CEIDP) - Measurement of space charge accumulation in Dicyclopentadiene resin film at high temperature under high DC stress
Ono, Taiki, Taira, Masakazu, Miyake, Hiroaki, Tanaka, YasuhiroYear:
2016
Language:
english
DOI:
10.1109/CEIDP.2016.7785582
File:
PDF, 273 KB
english, 2016