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[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - A novel technique to detect Aging in analog/mixed-signal circuits
Ahmadi, Mehrnaz, Jafari, RasoulYear:
2016
Language:
english
DOI:
10.1109/EWDTS.2016.7807643
File:
PDF, 269 KB
english, 2016