[IEEE 2016 IEEE East-West Design & Test Symposium...

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[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - Critical path selection under NBTI/PBTI aging for adaptive frequency tuning

Gomez, Andres F., Champac, Victor
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Year:
2016
Language:
english
DOI:
10.1109/EWDTS.2016.7807652
File:
PDF, 301 KB
english, 2016
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