[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - High output hamming-distance achievement by a greedy logic masking approach
Samimi, Seyyed Mohammad Saleh, Aerabi, Ehsan, Nejat, Arash, Fazeli, Mahdi, Hely, David, Beroulle, VincentYear:
2016
Language:
english
DOI:
10.1109/EWDTS.2016.7807657
File:
PDF, 200 KB
english, 2016