[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - NBTI mitigation by M-IVC with input duty cycle and randomness constraints
Yi, Maoxiang, Liu, Xiaohong, Wu, Qingwu, Ni, Tianming, Huang, Zhengfeng, Liang, HuaguoYear:
2016
Language:
english
DOI:
10.1109/EWDTS.2016.7807666
File:
PDF, 1010 KB
english, 2016