[IEEE 2016 IEEE East-West Design & Test Symposium (EWDTS) - Yerevan, Armenia (2016.10.14-2016.10.17)] 2016 IEEE East-West Design & Test Symposium (EWDTS) - A fault-tolerant sequential circuit design for soft errors based on fault-secure circuit
Ostanin, S., Matrosova, A., Butorina, N., Lavrov, V.Year:
2016
Language:
english
DOI:
10.1109/EWDTS.2016.7807676
File:
PDF, 195 KB
english, 2016