[IEEE 2016 5th International Conference on Reliability,...

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[IEEE 2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - Noida, India (2016.9.7-2016.9.9)] 2016 5th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO) - An epileptic sensor network over high speed networks

Siraj, Mohammad, Umair, Syed M.
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Year:
2016
Language:
english
DOI:
10.1109/ICRITO.2016.7785030
File:
PDF, 406 KB
english, 2016
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