VCO in 90 nm CMOS

IEEE Journal of Solid-State Circuits 2017 / 3 Vol. 52; Iss. 3

VCO in 90 nm CMOS

Yoon, Jong-Hyeok, Kwon, Soon-Won, Bae, Hyeon-Min
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Volume:
52
Language:
english
Journal:
IEEE Journal of Solid-State Circuits
DOI:
10.1109/JSSC.2016.2646803
Date:
March, 2017
File:
PDF, 3.62 MB
english, 2017
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