Surface structure of in situ...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2016 / 07 Vol. 34; Iss. 4

Surface structure of in situ cleaved single crystal Bi 2 Se 3 measured by low energy ion scattering

Zhou, Weimin, Zhu, Haoshan, Yarmoff, Jory A.
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Volume:
34
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4955134
Date:
July, 2016
File:
PDF, 735 KB
english, 2016
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