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Fabrication and Characterization of Atomic Force Microscopy-Assisted Normally-Off AlGaN/GaN Heterostructure Field Effect Transistors
Yu, Susanna, Lee, Jung-Ho, Koo, Sang-MoVolume:
16
Language:
english
Journal:
Journal of Nanoscience and Nanotechnology
DOI:
10.1166/jnn.2016.13688
Date:
December, 2016
File:
PDF, 3.54 MB
english, 2016