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Effects of oxygen flow rate on the electrical stability of zinc oxynitride thin-film transistors
Kim, Dae-Hwan, Jeong, Hwan-Seok, Jeong, Chan-Yong, Song, Sang-Hun, Kwon, Hyuck-InVolume:
56
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.7567/JJAP.56.020301
Date:
February, 2017
File:
PDF, 917 KB
english, 2017