Thermal boundary resistance at Si/Ge interfaces by molecular dynamics simulation
Zhan, Tianzhuo, Minamoto, Satoshi, Xu, Yibin, Tanaka, Yoshihisa, Kagawa, YutakaVolume:
5
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4916974
Date:
April, 2015
File:
PDF, 2.23 MB
english, 2015