[IEEE 2016 IEEE International Conference on Microwave and...

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[IEEE 2016 IEEE International Conference on Microwave and Millimeter Wave Technology (ICMMT) - Beijing, China (2016.6.5-2016.6.8)] 2016 IEEE International Conference on Microwave and Millimeter Wave Technology (ICMMT) - The influence of the measurement probe in nearfield measure

Meng Cao,, Zhenghui Xue,, Ruoqing Zhu,, Hongwei Cai,, Zhen Pei,
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Year:
2016
Language:
english
DOI:
10.1109/ICMMT.2016.7761741
File:
PDF, 766 KB
english, 2016
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