[IEEE 2016 IEEE SENSORS - Orlando, FL, USA (2016.10.30-2016.11.3)] 2016 IEEE SENSORS - Noise reduction, error analysis and experimental fiability for 3D deformation measurement with digital color holography
Montresor, Silvio, Picart, Pascal, Sakharuk, Oleksandr, Muravsky, LeonidYear:
2016
Language:
english
DOI:
10.1109/ICSENS.2016.7808477
File:
PDF, 456 KB
english, 2016