[IEEE 2016 International Symposium on Integrated Circuits (ISIC) - Singapore (2016.12.12-2016.12.14)] 2016 International Symposium on Integrated Circuits (ISIC) - Co-mitigating circuit PBTI and HCI aging considering NMOS transistor stacking effect
Maoxiang Yi,, Yingxian Gan,, Zhengfeng Huang,, Huaguo Liang,Year:
2016
Language:
english
DOI:
10.1109/ISICIR.2016.7829675
File:
PDF, 713 KB
english, 2016