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[IEEE 2016 IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT) - Bangalore, India (2016.5.20-2016.5.21)] 2016 IEEE International Conference on Recent Trends in Electronics, Information & Communication Technology (RTEICT) - Analysing MTL properties using NuSMV model checker
Shreya, V, Nanda, ManjuYear:
2016
Language:
english
DOI:
10.1109/RTEICT.2016.7807940
File:
PDF, 1.00 MB
english, 2016