Superconductor Integrated Circuit (IC) Testing With the...

IEEE Transactions on Appiled Superconductivity 2017 / 6 Vol. 27; Iss. 4

Superconductor Integrated Circuit (IC) Testing With the Integrated Cryogenic Electronics Testbed (ICE-T)

Dotsenko, Vladimir V., Chonigman, Benjamin, Sahu, Anubhav, Tang, Jia, Lehmann, A. Erik, Sarwana, Saad, Gupta, Deepnarayan
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Volume:
27
Language:
english
Journal:
IEEE Transactions on Applied Superconductivity
DOI:
10.1109/TASC.2017.2654342
Date:
June, 2017
File:
PDF, 792 KB
english, 2017
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