A Novel Metamaterial Enhanced Microwave Testing System for...

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A Novel Metamaterial Enhanced Microwave Testing System for Bare PCB Substrates Using Image Rendering Approach

Samsingh, Vimal R., Kanagasabai, Malathi, Sundarsingh, Esther Florence
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Year:
2017
Language:
english
Journal:
IEEE Transactions on Components, Packaging and Manufacturing Technology
DOI:
10.1109/TCPMT.2016.2633974
File:
PDF, 1.55 MB
english, 2017
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