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[IEEE 2016 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) - Gwalior, India (2016.12.19-2016.12.21)] 2016 IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) - Performance Analysis of Wavy FinFET and Optimization for Leakage Reduction
Anju, C., Kuruvilla, Nisha, Khan, T. E. Ayoob, Hameed, T. A. ShahulYear:
2016
Language:
english
DOI:
10.1109/iNIS.2016.030
File:
PDF, 898 KB
english, 2016