![](/img/cover-not-exists.png)
Modeling of asymmetric degradation based on a non-uniform electric field and temperature in amorphous In–Ga–Zn–O thin film transistors
Kim, Jong In, Jeong, Chan-Yong, Kwon, Hyuck-In, Jung, Keum Dong, Park, Mun Soo, Kim, Ki Hwan, Seo, Mi Seon, Lee, Jong-HoVolume:
32
Language:
english
Journal:
Semiconductor Science and Technology
DOI:
10.1088/1361-6641/aa59a6
Date:
March, 2017
File:
PDF, 691 KB
english, 2017