Extraction of BEOL Contributions for Thermal Resistance in...

IEEE Transactions on Electron Devices 2017 / 3 Vol. 64; Iss. 3

Extraction of BEOL Contributions for Thermal Resistance in SiGe HBTs

Balanethiram, Suresh, D'Esposito, Rosario, Chakravorty, Anjan, Fregonese, Sebastien, Zimmer, Thomas
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Volume:
64
Language:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2016.2645615
Date:
March, 2017
File:
PDF, 1.33 MB
english, 2017
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