Improved Multiple Faults-Aware Placement Strategy: Reducing...

IEEE Transactions on Reliability 2017 / 3 Vol. 66; Iss. 1

Improved Multiple Faults-Aware Placement Strategy: Reducing the Overheads and Error Rates in Digital Circuits

Bandan, Mohamad Imran, Pagliarini, Samuel, Mathew, Jimson, Pradhan, Dhiraj
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Volume:
66
Language:
english
Journal:
IEEE Transactions on Reliability
DOI:
10.1109/TR.2016.2643010
Date:
March, 2017
File:
PDF, 906 KB
english, 2017
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