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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Optical Metrology and Inspection for Industrial Applications IV - Research of non-contact measurement method for outline dimensions of some special workpiece
Han, Sen, Yoshizawa, Toru, Zhang, Song, Feng, Qiaoling, Guo, YongcaiVolume:
10023
Year:
2016
Language:
english
DOI:
10.1117/12.2247896
File:
PDF, 501 KB
english, 2016