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[IEEE 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) - Portland, OR, USA (2016.6.5-2016.6.10)] 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) - On the source of silicon minority-carrier lifetime degradation during molecular beam heteroepitaxial growth of III-V materials
Ding, Laura, Zhang, Chaomin, Norland, Tine Uberg, Faleev, Nikolai, Honsberg, Christiana, Bertoni, Mariana I.Year:
2016
Language:
english
DOI:
10.1109/pvsc.2016.7749989
File:
PDF, 389 KB
english, 2016