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[IEEE 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) - Portland, OR, USA (2016.6.5-2016.6.10)] 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) - Band alignments at native oxide/BaSi2 and amorphous-Si/BaSi2 interfaces measured by hard x-ray photoelectron spectroscopy
Takabe, Ryota, Takeuchi, Hiroki, Du, Weijie, Ito, Keita, Toko, Kaoru, Ueda, Shigenori, Kimura, Akio, Suemasu, TakashiYear:
2016
Language:
english
DOI:
10.1109/pvsc.2016.7750168
File:
PDF, 375 KB
english, 2016