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[IEEE 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) - Portland, OR, USA (2016.6.5-2016.6.10)] 2016 IEEE 43rd Photovoltaic Specialists Conference (PVSC) - Measuring relative carrier concentrations at the nanoscale using scanning microwave impedance microscopy: The case of CdTe solar cells
Tuteja, Mohit, Koirala, Prakash, Palekis, Vasilios, MacLaren, Scott, Ferekides, Christos S., Collins, Robert W., Rockett, Angus A.Year:
2016
Language:
english
DOI:
10.1109/pvsc.2016.7750293
File:
PDF, 560 KB
english, 2016