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Quantitative Structural Analysis of Complex Materials by Scanning Nanobeam Diffraction
Gammer, Christoph, Özdöl, Burak V., Bustillo, Karen C., Ciston, J., Minor, Andrew M.Volume:
22
Language:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927616003366
Date:
July, 2016
File:
PDF, 549 KB
english, 2016