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Adhesion Energy of MoS 2 Thin Films on Silicon-Based Substrates Determined via the Attributes of a Single MoS 2 Wrinkle
Deng, Shikai, Gao, Enlai, Xu, Zhiping, Berry, VikasVolume:
9
Language:
english
Journal:
ACS Applied Materials & Interfaces
DOI:
10.1021/acsami.6b16175
Date:
March, 2017
File:
PDF, 1.52 MB
english, 2017