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[IEEE 2016 International Conference on Condition Monitoring and Diagnosis (CMD) - Xi'an, China (2016.9.25-2016.9.28)] 2016 International Conference on Condition Monitoring and Diagnosis (CMD) - Feature optimization selection and dimension reduction for partial discharge pattern recognition
Shi-Qiang Wang,, Jia-Ning Zhang,, Hai-Yan Hu,, Quan-Zhen Liu,, Ming-Xiao Zhu,, Hai-Bao Mu,, Guan-Jun Zhang,Year:
2016
Language:
english
DOI:
10.1109/CMD.2016.7757962
File:
PDF, 1.13 MB
english, 2016