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SPIE Proceedings [SPIE SPIE Nanoscience + Engineering - San Diego, California, United States (Sunday 28 August 2016)] Nanoengineering: Fabrication, Properties, Optics, and Devices XIII - X-ray induced chemical reaction revealed by in-situ X-ray diffraction and scanning X-ray microscopy in 15 nm resolution (Conference Presentation)
Campo, Eva M., Dobisz, Elizabeth A., Eldada, Louay A., Ge, Mingyuan, Liu, Wenjun, Bock, David, De Andrade, Vincent, Yan, Hanfei, Huang, Xiaojing, Marschilok, Amy, Takeuchi, Esther, Xin, Huolin, Chu, YVolume:
9927
Year:
2016
Language:
english
DOI:
10.1117/12.2237229
File:
PDF, 115 KB
english, 2016