Anneal induced transforms of radiation defects in heavily electron irradiated Si diodes
Rumbauskas, V., Meskauskaite, D., Ceponis, T., Gaubas, E.Volume:
11
Language:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/11/09/P09004
Date:
September, 2016
File:
PDF, 2.96 MB
english, 2016