[IEEE 2016 International Conference on Informatics, Electronics and Vision (ICIEV) - Dhaka, Bangladesh (2016.5.13-2016.5.14)] 2016 5th International Conference on Informatics, Electronics and Vision (ICIEV) - Characterization and localization of performance-bugs using Naive Bayes approach
Sujon, Mohammad, Shafiuzzaman, Md., Rahman, Md. Masudur, Rahman, RayhanurYear:
2016
Language:
english
DOI:
10.1109/ICIEV.2016.7760110
File:
PDF, 930 KB
english, 2016