SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Unconventional Imaging, Wavefront Sensing, and Adaptive Coded Aperture Imaging and Non-Imaging Sensor Systems - Comparing the sensitivities of intensity interferometry and Michelson interferometry
Armstrong, J. T., Dolne, Jean J., Karr, Thomas J., Mozurkewich, D., Schmitt, H. R., Gamiz, Victor L., Rogers, Stanley, Restaino, S. R., Hindsley, R. B., Casasent, David P.Volume:
8165
Year:
2011
Language:
english
DOI:
10.1117/12.894039
File:
PDF, 301 KB
english, 2011