[AIP NEGATIVE IONS, BEAMS AND SOURCES: Proceedings of the 1st International Symposium on Negative Ions, Beams and Sources - Aix-en-Provence (France) (9–12 September 2008)] AIP Conference Proceedings - Modeling of the Plasma Electrode Bias in the Negative Ion Sources with 1D PIC Method
Matsushita, D., Kuppel, S., Hatayama, A., Fukano, A., Bacal, M., Surrey, Elizabeth, Simonin, AlainYear:
2009
DOI:
10.1063/1.3112536
File:
PDF, 875 KB
2009