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Impact of crystalline defects and size on X-ray line broadening: A phenomenological approach for tetragonal SnO 2 nanocrystals
Muhammed Shafi, P., Chandra Bose, A.Volume:
5
Language:
english
Journal:
AIP Advances
DOI:
10.1063/1.4921452
Date:
May, 2015
File:
PDF, 3.46 MB
english, 2015