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In-operando synchronous time-multiplexed O K-edge x-ray absorption spectromicroscopy of functioning tantalum oxide memristors
Kumar, Suhas, Graves, Catherine E., Strachan, John Paul, Kilcoyne, A. L. David, Tyliszczak, Tolek, Nishi, Yoshio, Williams, R. StanleyVolume:
118
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4926477
Date:
July, 2015
File:
PDF, 1.64 MB
english, 2015