Origin analysis of thermal neutron soft error rate at...

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures 2015 / 03 Vol. 33; Iss. 2

Origin analysis of thermal neutron soft error rate at nanometer scale

Yamazaki, Takashi, Kato, Takashi, Uemura, Taiki, Matsuyama, Hideya, Tada, Yoko, Yamazaki, Kazutoshi, Soeda, Takeshi, Miyajima, Toyoo, Kataoka, Yuji
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Volume:
33
Language:
english
Journal:
Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
DOI:
10.1116/1.4907400
Date:
March, 2015
File:
PDF, 2.56 MB
english, 2015
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