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SPIE Proceedings [SPIE SPIE/COS Photonics Asia - Beijing, China (Wednesday 12 October 2016)] Optical Metrology and Inspection for Industrial Applications IV - Non-uniform sampling knife-edge method for camera modulation transfer function measurement
Han, Sen, Yoshizawa, Toru, Zhang, Song, Duan, Yaxuan, Xue, Xun, Chen, Yongquan, Tian, Liude, Zhao, Jianke, Gao, LiminVolume:
10023
Year:
2016
Language:
english
DOI:
10.1117/12.2245840
File:
PDF, 557 KB
english, 2016